EDAX Introduces OIM™ Analysis 8.0 Market-Leading Electron Backscatter Diffraction (EBSD) Software
MAHWAH, NJ – EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, continues to lead the industry with its recent release of OIM™ Analysis 8.0. Widely established as the premier microstructural visualization and analysis tool for the interrogation and understanding of EBSD mapping data, OIM™ Analysis now includes multiple new features that enable analysts to achieve new insights into their materials characterization. · Multithreaded Operations use optimized code to take advantage of modern multicore CPUs ensuring faster map rendering, highlighting and