EDAX Pairs Element Silicon Drift Detector with New APEX Software Package For Tabletop Scanning Electron Microscopes
Latest SDD Product Line Designed to Serve Industrial Market MAHWAH, NJ – EDAX, Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, has introduced new APEX Analysis software for its Element SDD silicon drift detector for tabletop scanning electron microscopes (SEMs), a product line focused on serving the needs of the industrial market. The APEX software package for Element was developed with a primary focus on industrial needs and ensures high-end results, combined with ease of use. Built on fundamentally new quantification algorithms, APEX accelerates and