CAMECA Launches EIKOS™, New Cost-Effective Atom Probe Microscope for Research and Industry
EIKOS Enables Routine, High-Performance 3D Nanoanalysis For Both Industrial and Research Applications Contact: Marion Chopin +33 1 433 46250 marion.chopin@ametek.com MADISON, WI, USA – CAMECA, a world leader in scientific instrumentation and metrology solutions, is pleased to announce the release of EIKOS™, a new atom probe microscope. EIKOS provides accessibility to atom probe tomography with increased ease of use and a low cost of ownership. Utilizing standard microscopy sample preparation methods, it delivers nanoscale structural information that is expected to yield a greater