New SPECTRO XEPOS Spectrometers Redefine ED-XRF With Exceptional New Levels of Elemental Analysis Performance

Kleve, Germany — SPECTRO Analytical Instruments today announced its new line of SPECTRO XEPOS spectrometers, representing a quantum leap in energy dispersive X-ray fluorescence  (ED-XRF) technology and providing breakthrough advances in the multi-elemental analysis  of major, minor, and trace element concentrations. New developments in excitation and detection introduced with the new SPECTRO XEPOS ED-XRF  spectrometers deliver outstanding sensitivity and detection limits and yield remarkable gains