CAMECA Launches Next Generation Atom Probe Microscope

New LEAP® 5000 Delivers Unmatched 3D Sub-Nanometer Analytical Performance Across a Wide Variety of Metals, Semiconductors, and InsulatorsCAMECA, a world leader in scientific instrumentation and metrology solutions, is pleased to announce the release of its latest generation atom probe microscope. The LEAP 5000 offers unparalleled 3-dimensional nano-scale surface, bulk and interfacial materials analysis with atom-by-atom identification and accurate spatial positioning. “CAMECA is very proud to introduce the LEAP 5000,” notes Dr. Tom Kelly, CAMECA Vice President for Innovation and New