EDAX LAUNCHES NEW XLNCE SERIES OF XRF ANALYZERS FOR COATING THICKNESS AND COMPOSITION ANALYSIS

Unveils First in a New Series of XRF Analyzers at Pittcon 2015EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, has launched the XLNCE SMX-BEN, the first in a series of new XRF analyzers for rapid, non-destructive coating thickness and composition analysis. The SMX-BEN benchtop analyzer, which is being shown for the first time at Pittcon 2015, is a metrology tool for process development and quality control. It is capable of quickly and easily analyzing both multi-layered and single-layered substrates containing up to 30 elements, with layers ranging