EDAX Introduces Octane Series of Silicon Drift Detectors for Fast, High-Quality Energy Dispersive Spectroscopy (EDS) Microscopy

MAHWAH, NJ, USA – Building on the success of its original Octane Silicon Drift Detector (SDD) Series for the TEAM™ EDS Analysis System, EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, has announced the addition of a new series of Octane Elite SDDs to its existing portfolio of detectors. EDAX will introduce the new SDDs at the upcoming Microscopy and Microanalysis 2015 Conference, August 3 to 6, 2015 in Portland, OR (Booth #445). The Octane Elite SDD Series offers an up to 35% improvement in light element sensitivity and outstanding low-energy