IAR Systems now shipping I-scope probe for real-time current and voltage measurements
Simplifies low-power development through extended technology platform for Power Debugging Design West, San Jose, California—April 23, 2013—Today, IAR Systems® starts shipping the latest addition to its innovative Power Debugging technology. The I-scope™ probe extends the power optimization possibilities available in IAR Embedded Workbench®. Used together with IAR Systems’ in-circuit debugging probe I-jet™, I-scope lets developers optimize their applications for power consumption and possibly extend battery lifetime by offering them knowledge of the power consumed by individual