IAR Systems further strengthens product portfolio for power analysis

New I-scope probe facilitates low-power development by adding in-circuit power measurements Embedded World, Nuremberg, Germany—February 26, 2013— Today, IAR Systems® announces further enhancements to its innovative Power Debugging technology. At Embedded World in Germany, the company demonstrates new functionality in its world-leading development tool suite IAR Embedded Workbench® for ARM®. This functionality includes detailed in-circuit power measurements made possible by IAR Systems’ new I-scope™ probe. Power Debugging provides developers with information about how the