EDAX Launches SMX-ILH Process Metrology Platform
Latest Addition to the XLNCE Series of XRF Analyzers for Coating Thickness and Composition Analysis MAHWAH, NJ – EDAX Inc., a leader in X-ray elemental analysis and electron diffraction instrumentation, has launched the XLNCE SMX-ILH, the latest in a series of new XRF analyzers for rapid, non-destructive coating thickness and composition analysis.The SMX-ILH process metrology system is an in-line process metrology tool, capable of integration into a production conveyor system or manual loading. Like the SMX-BEN benchtop analyzer, it is able to quickly and easily measure the thickness and