EDAX Achieves Next Level Microstructural Imaging with PRIAS for Scanning Electron Microscopes

MAHWAH, NJ – EDAX, Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, has developed a new advanced imaging tool that allows Scanning Electron Microscopes to obtain crystallographic, compositional and topographical contrast images with unprecedented flexibility in signal collection and processing.

Pattern Region of Interest Analysis System or PRIAS is a ground-breaking imaging tool that allows users to gain new insights through advanced microstructural imaging. It synergistically uses an EDAX Hikari XP or DigiView camera to visualize and characterize the microstructure of materials.

PRIAS has three modes of operation:

• PRIAS Live provides fast microstructural imaging without the need to collect and index electron backscatter diffraction (EBSD) patterns.
• PRIAS Collection generates PRIAS images simultaneously with traditional EBSD mapping to bring new types of data into OIM™ EBSD software. 
• PRIAS Analysis enables powerful image manipulation to help directly correlate PRIAS information with site-specific orientation, phase, and chemical data.

“PRIAS is an exciting new technique that enhances the ability of our TEAM™ software platform to provide our customers with the information they need in their material analysis work. PRIAS eliminates the need for multiple Forward Scatter Detectors and their accompanying amplification electronics by using our EBSD cameras for both imaging and EBSD pattern collection,” comments Matt Nowell, EBSD Product Manager. 

“By going from analog to digital collection, PRIAS provides complete flexibility in detector positioning, with up to 25 locations across the EBSD phosphor screen to obtain multiple contrast channels simultaneously.  This data can then be easily processed and analyzed through addition and subtraction of images as well as RGB color mixing and signal difference maps to unlock information previously not available.”

With applications on traditional EBSD materials including metals, ceramics, semiconductors, and geological samples as well as new opportunities for imaging plastic and glass materials, PRIAS represents a significant step in microstructural characterization for EDAX customers.

EDAX is the acknowledged leader in Energy Dispersive Microanalysis, Electron Backscatter Diffraction and X-ray Fluorescence instrumentation. EDAX designs, manufactures, installs and services high-quality products and systems for leading companies in the semiconductor, metals, geological, pharmaceutical, biomaterials, and ceramics markets.

Since 1962, EDAX has used its knowledge and experience to develop ultra-sensitive silicon radiation sensors, digital electronics and specialized application software that facilitate solutions to research, development and industrial requirements.

EDAX is a unit of AMETEK Materials Analysis Division. AMETEK, Inc. is a leading global manufacturer of electronic instruments and electromechanical devices with annual sales of $3.6 billion.

For further information about EDAX, contact: Sue Arnell EDAX 91 McKee Drive, Mahwah, NJ 07430 Tel: (201) 529-4880 • Fax: (201) 529-3156 E-mail: info.edax@ametek.com

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