EDAX Achieves Next Level Microstructural Imaging with PRIAS for Scanning Electron Microscopes
MAHWAH, NJ – EDAX, Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, has developed a new advanced imaging tool that allows Scanning Electron Microscopes to obtain crystallographic, compositional and topographical contrast images with unprecedented flexibility in signal collection and processing.
Pattern Region of Interest Analysis System or PRIAS is a ground-breaking imaging tool that allows users to gain new insights through advanced microstructural imaging. It synergistically uses an EDAX Hikari XP or DigiView camera to visualize and characterize the