VTT's multi-million investment in a plasma-FIB scanning electron microscope catapults Finland to the forefront of Nordic materials research
Press release, 26 March 2024 The first plasma-FIB scanning electron microscope in Finland has just become operational at VTT in Espoo, Finland. This multi-million investment will significantly contribute to materials research for applications such as hydrogen economy, microelectronics, and the marine industry, as well as to material damage investigation.A TESCAN AMBER X system, Finland's first Focused Ion Beam (FIB) Scanning Electron Microscope (SEM) using Xenon plasma, has been taken into use at VTT Technical Research Centre of Finland. In the Nordic countries, there are just a handful