EDAX Introduces Octane Series SDDs for Tranmission Electron Microscopes
MAHWAH, NJ, February 25, 2014 – EDAX, Inc. a leader in X-ray microanalysis and electron diffraction instrumentation, introduces a new series of detectors for the Transmission Electron Microscope (TEM) into its highly successful Octane Silicon Drift Detector (SDD) family. Based on the state-of-the-art design of the company’s Octane SEM series, the Octane TEM portfolio offers three models to meet the needs of all TEM applications. The Octane TEM Series offers modules sized from 30 mm2to 100 mm2and provides solid angles up to 1.1 steradian. Built with EDAX Smart detector design, the